Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8644574 | Measurement of thin-layered structures in X-ray computer tomography | Raul San Jose Estepar, George R. Washko, JR., Edwin K. Silverman, John J. Reilly, Ron Kikinis | 2014-02-04 |
| 6718054 | MRA segmentation using active contour models | Liana M. Lorigo, W. Eric L. Grimson, Olivier Faugeras, Renaud Keriven, Ron Kikinis | 2004-04-06 |