Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4400884 | Skin contour inspection system | Joseph M. Baresh, Elmer Hisey | 1983-08-30 |
| 4240206 | Ovality measuring device and method | Joseph M. Baresh | 1980-12-23 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4400884 | Skin contour inspection system | Joseph M. Baresh, Elmer Hisey | 1983-08-30 |
| 4240206 | Ovality measuring device and method | Joseph M. Baresh | 1980-12-23 |