Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5000037 | Gauging apparatus and method | — | 1991-03-19 |
| 4703648 | Gauging apparatus and method | — | 1987-11-03 |
| 4400884 | Skin contour inspection system | Elmer Hisey, Robert E. Nash | 1983-08-30 |
| 4240206 | Ovality measuring device and method | Robert E. Nash | 1980-12-23 |