Issued Patents All Time
Showing 201–221 of 221 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6181852 | Optical grating device with variable coating | Laura Ellen Adams, Benjamin John Eggleton, Rolando Patricio Espindola, Sungho Jin, Hareesh Mavoori +1 more | 2001-01-30 |
| 6175421 | Method and apparatus for measuring material properties using transient-grating spectroscopy | Martin Fuchs, Matthew Banet | 2001-01-16 |
| 6169831 | Method of making optical chirped grating with an intrinsically chirped grating and external gradient | Laura Ellen Adams, Benjamin John Eggleton, Rolando Patricio Espindola, Sungho Jin, Hareesh Mavoori +1 more | 2001-01-02 |
| 6150668 | Thin-film transistor monolithically integrated with an organic light-emitting diode | Zhenan Bao, Ananth Dodabalapur, Howard Edan Katz, Venkataram R. Raju | 2000-11-21 |
| 6148127 | Tunable dispersion compensator and optical system comprising same | Laura Ellen Adams, Benjamin John Eggleton, Rolando Patricio Espindola, Sungho Jin, Hareesh Mavoori +1 more | 2000-11-14 |
| 6118533 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Matthew Banet, Martin Fuchs | 2000-09-12 |
| 6081330 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, Matthew Banet, John Hanselman, Martin Fuchs | 2000-06-27 |
| 6075602 | Method and apparatus for measuring material properties using transient-grating spectroscopy | Martin Fuchs, Matthew Banet | 2000-06-13 |
| 6069703 | Method and device for simultaneously measuring the thickness of multiple thin metal films in a multilayer structure | Matthew Banet, Martin Fuchs, Keith A. Nelson, Timothy F. Crimmins, Alexei Maznev | 2000-05-30 |
| 6052185 | Method and apparatus for measuring the concentration of ions implanted in semiconductor materials | Matthew Banet, Martin Fuchs | 2000-04-18 |
| 6033202 | Mold for non - photolithographic fabrication of microstructures | Zhenan Bao | 2000-03-07 |
| 6016202 | Method and apparatus for measuring material properties using transient-grating spectroscopy | Martin Fuchs, Matthew Banet | 2000-01-18 |
| 5982482 | Determining the presence of defects in thin film structures | Keith A. Nelson | 1999-11-09 |
| 5951881 | Fabrication of small-scale cylindrical articles | Rebecca J. Jackman, George M. Whitesides | 1999-09-14 |
| 5812261 | Method and device for measuring the thickness of opaque and transparent films | Keith A. Nelson, Matthew Banet, John Hanselman, Martin Fuchs | 1998-09-22 |
| 5734470 | Device and method for time-resolved optical measurements | Keith A. Nelson | 1998-03-31 |
| 5672830 | Measuring anisotropic mechanical properties of thin films | Keith A. Nelson, Lisa Dhar | 1997-09-30 |
| 5633711 | Measurement of material properties with optically induced phonons | Keith A. Nelson, Anil Raj Duggal | 1997-05-27 |
| 5546811 | Optical measurements of stress in thin film materials | Keith A. Nelson | 1996-08-20 |
| 5251286 | Method for estimating formation permeability from wireline logs using neural networks | Jacky M. Wiener, Robert F. Moll | 1993-10-05 |
| 4534191 | Security lock for sliding doors | Malcolm J. White | 1985-08-13 |