Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11585844 | Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors | Bhanu Teja Vankayalapati, Bilal Akin, Shi Pu, Fei Yang | 2023-02-21 |