Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11585844 | Systems, circuits, and methods to detect gate-open failures in MOS based insulated gate transistors | Bilal Akin, Shi Pu, Fei Yang, Masoud Farhadi | 2023-02-21 |
| 11525740 | Methods of measuring real-time junction temperature in silicon carbide power MOSFET devices using turn-on delay, related circuits, and computer program products | Bilal Akin, Fei Yang, Shi Pu, Chi Xu | 2022-12-13 |
| 11397209 | Methods of monitoring conditions associated with aging of silicon carbide power MOSFET devices in-situ, related circuits and computer program products | Bilal Akin, Shi Pu, Enes Ugur, Fei Yang, Chi Xu | 2022-07-26 |