Issued Patents All Time
Showing 51–58 of 58 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5294801 | Extended source e-beam mask imaging system including a light source and a photoemissive source | Denis F. Spicer | 1994-03-15 |
| 5208531 | Apparatus and method for testing integrated circuits | — | 1993-05-04 |
| 5159752 | Scanning electron microscope based parametric testing method and apparatus | Shivaling S. Mahant-Shetti, Rebecca J. Gale | 1992-11-03 |
| 5156942 | Extended source E-beam mask imaging system and method | Denis F. Spicer | 1992-10-20 |
| 5128612 | Disposable high performance test head | Rey M. Rincon | 1992-07-07 |
| 5059897 | Method and apparatus for testing passive substrates for integrated circuit mounting | Satwinder Malhi, Masashi Hashimoto, Shivaling S. Mahant-Shitti, Oh-Kyong Kwon, Thirumalai Sridhar | 1991-10-22 |
| 5053699 | Scanning electron microscope based parametric testing method and apparatus | — | 1991-10-01 |
| 4978908 | Scanning electron microscope based parametric testing method and apparatus | Shivaling S. Mahant-Shetti, Rebeca J. Gale | 1990-12-18 |