Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11927604 | Multi-site concurrent wafer probe magnetic circuit testing | Xinkun Huang, Dok Won Lee, Christopher Michael Ledbetter, Bret Alan Dahl | 2024-03-12 |
| 9704171 | Methods and systems for quantifying and tracking software application quality | Jason Joseph Arbon, Jeffrey Carollo, Sebastián Schiavone-Ruthensteiner, Heidi Young, Jason M. Stredwick | 2017-07-11 |