Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11927604 | Multi-site concurrent wafer probe magnetic circuit testing | Xinkun Huang, Dok Won Lee, Christopher Michael Ledbetter, Roy Deidrick Solomon | 2024-03-12 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11927604 | Multi-site concurrent wafer probe magnetic circuit testing | Xinkun Huang, Dok Won Lee, Christopher Michael Ledbetter, Roy Deidrick Solomon | 2024-03-12 |