RW

Randy L. Williams

TI Texas Instruments: 2 patents #5,248 of 12,488Top 45%
Overall (All Time): #2,167,601 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7027946 Broadside compare with retest on fail Glenn R. Fitzgerald, Michael Anthony Henson, Julian I. Gloria, Bruce D. Bishop 2006-04-11
6014033 Method of identifying the point at which an integrated circuit fails a functional test Glenn R. Fitzgerald, Eric Gregory Moore 2000-01-11