Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7027946 | Broadside compare with retest on fail | Randy L. Williams, Michael Anthony Henson, Julian I. Gloria, Bruce D. Bishop | 2006-04-11 |
| 6061507 | Scheduling diagnostic testing of automated equipment for testing integrated circuit devices | Lowell Boggs, Amy Dessert, Michael Allen Walsh, Eric Gregory Moore, Stephanie Smith +1 more | 2000-05-09 |
| 6014033 | Method of identifying the point at which an integrated circuit fails a functional test | Eric Gregory Moore, Randy L. Williams | 2000-01-11 |