Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6574760 | Testing method and apparatus assuring semiconductor device quality and reliability | — | 2003-06-03 |
| 6243841 | Automated test and evaluation sampling system and method | — | 2001-06-05 |
| 5471145 | Calibrating transition dependent timing errors in automatic test equipment using a precise pulse width generator | — | 1995-11-28 |
| 5265101 | Function array sequencing for VLSI test system | Mark Carlson | 1993-11-23 |
| 5151903 | High efficiency pattern sequence controller for automatic test equipment | Sheila O'Keefe | 1992-09-29 |
| 5028878 | Dual memory timing system for VLSI test systems | Mark Carlson | 1991-07-02 |
| 5025205 | Reconfigurable architecture for logic test system | Sam R. Pile, Sheila O'Keefe, Neal F. Okerblom, W. Russ Keenan | 1991-06-18 |
| 4870346 | Distributed pseudo random sequence control with universal polynomial function generator for LSI/VLSI test systems | Theo J. Powell | 1989-09-26 |
| 4855969 | Dynamic timing reference alignment system | — | 1989-08-08 |