Issued Patents All Time
Showing 176–200 of 865 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10036776 | TMS pin for mode signal and output for read data | — | 2018-07-31 |
| 10024918 | Cores, TAMS, TAM controllers, TAM selector, and scan router circuitry | — | 2018-07-17 |
| 10024913 | Tap commandable data register control router inverted TCK, TMS/TDI imputs | — | 2018-07-17 |
| 10024912 | One tap domain coupling two trace circuits, address command port | — | 2018-07-17 |
| 10020032 | 2-pin interface data input and output, controller and instruction circuitry | — | 2018-07-10 |
| 10012695 | Die top, bottom parallel/serial date with test and scan circuitry | — | 2018-07-03 |
| 10006962 | Serial I/O communication control signals coupled to tap control signals | — | 2018-06-26 |
| 9995788 | Receiving addresses on moving TLR to R/TI when TDI high | — | 2018-06-12 |
| 9983263 | Interface circuit for scan paths providing separate multiplexer controls | — | 2018-05-29 |
| 9964594 | Serial test core wrapper link instruction register with resynchronization register | — | 2018-05-08 |
| 9964592 | TDI, SC, and SE gating circuitry with count complete input | — | 2018-05-08 |
| 9958503 | Tap SPC with tap state machine reset and clock control | — | 2018-05-01 |
| 9939489 | IC cores, scan paths, compare circuitry, select and enable inputs | — | 2018-04-10 |
| 9933483 | Addressable tap domain selection circuit with instruction and linking circuits | — | 2018-04-03 |
| 9929732 | LVDS input window circuit with two comparators and multiplexer | — | 2018-03-27 |
| 9927491 | IC and process shifting compressed data and loading scan paths | — | 2018-03-27 |
| 9903915 | Scan path interface with circular shift register, logic, register sets | — | 2018-02-27 |
| 9897654 | Two signal JTAG wafter testing bist and scan tap domains | — | 2018-02-20 |
| 9891284 | Addressable test access port domain selection circuitry TCK logic gate | — | 2018-02-13 |
| 9891278 | TMS serial communication circuitry coupled to tap IR enable output | — | 2018-02-13 |
| 9880222 | Testing TSV with current/voltage source, resistor, comparator, and scan cell | Baher Haroun | 2018-01-30 |
| 9857427 | Tap controller state machine scanning capturing plurality of scan paths | — | 2018-01-02 |
| 9835678 | Through substrate via scan cell with comparator mux, and flip-flop | — | 2017-12-05 |
| 9829538 | IC expected data and mask data on I/O data pads | Alan Hales | 2017-11-28 |
| 9824947 | Through silicon via, scan cell stimulus, response to two switches | — | 2017-11-21 |