Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7112288 | Methods for inspection sample preparation | Andrew Vance, David Gerald Farber | 2006-09-26 |
| 6642518 | Assembly and method for improved scanning electron microscope analysis of semiconductor devices | James D. Krouse, Ping Jiang, Robyn R. Carlson | 2003-11-04 |