Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9939488 | Field triage of EOS failures in semiconductor devices | Joseph M. Salazar, Rich Ackerman, John Raykowski, Armagan Akar | 2018-04-10 |
| 9659136 | Suspect logical region synthesis from device design and test information | Armagan Akar | 2017-05-23 |
| 8918753 | Correlation of device manufacturing defect data with device electrical test data | Armagan Akar | 2014-12-23 |
| 8626460 | Secure test-for-yield chip diagnostics management system and method | Bruce Kaufman, Brian Mason | 2014-01-07 |
| 8539389 | Correlation of device manufacturing defect data with device electrical test data | Armagan Akar | 2013-09-17 |
| 8453088 | Suspect logical region synthesis and simulation using device design and test information | Armagan Akar | 2013-05-28 |
| 7488073 | Pupillary reflex-based patient classification | Gillray L. Kandel, Martin B. Kaback | 2009-02-10 |
| 7334895 | Method, system and device for detecting ocular dysfunctions | Gillray L. Kandel, David B. Henson, Martin B. Kaback | 2008-02-26 |