Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8626460 | Secure test-for-yield chip diagnostics management system and method | Bruce Kaufman, Ralph Sanchez | 2014-01-07 |
| 7523055 | Financial information access system | William P. Anderson, Jacob B. Geller, G. Cotter Cunningham, Kris Rodgers | 2009-04-21 |
| 5428399 | Method and apparatus for image translation with improved motion compensation | Roger N. Robinson | 1995-06-27 |
| 4807161 | Automatic test equipment | John J. Comfort, Paul A. Hayter, Dinesh Kargathra, Graham N. Turner, Ian R. Fisher +1 more | 1989-02-21 |
| 4714875 | Printed circuit board fault location system | John W. Bailey, Paul A. Hayter, Graham N. Turner | 1987-12-22 |