Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7773112 | Automatic measurement of video parameters | Justin F. Whitling, Kathryn A. Engholm, Frederick A. Azinger | 2010-08-10 |
| 7061920 | Streaming media quality analyzer system | Kevin M. Ferguson, Gale Straney, George Williams | 2006-06-13 |
| 6795580 | Picture quality measurement using blockiness | Steven D. Maurer | 2004-09-21 |
| 6690840 | Image alignment with global translation and linear stretch | Shane Ching-Feng Hu | 2004-02-10 |
| 6671409 | Blockiness period detection of DCT-based codecs | Steven D. Maurer | 2003-12-30 |
| 6633329 | Frozen field detection of formerly encoded video | Steven D. Maurer | 2003-10-14 |
| 6437821 | Harmonic measurement of blockiness in video signals | John Raitz | 2002-08-20 |
| 6433819 | Detection of Gaussian noise in video signals | Bei Li | 2002-08-13 |
| 6377297 | Detection of repeated and frozen frames in a video signal | Kamalesh Patel | 2002-04-23 |
| 6075561 | Low duty-cycle transport of video reference images | — | 2000-06-13 |
| 5940124 | Attentional maps in objective measurement of video quality degradation | John W. Edwards | 1999-08-17 |
| 5818520 | Programmable instrument for automatic measurement of compressed video quality | David K. Fibush | 1998-10-06 |
| 5321365 | Reduced noise sensitivity in inverse scattering through filtering | Scott K. Diamond, Steven H. Pepper | 1994-06-14 |
| 5221895 | Probe with microstrip transmission lines | Valdis E. Garuts, J. Lynn Saunders | 1993-06-22 |
| 5202622 | Adapter and test fixture for an integrated circuit device package | Paul A. Cole, Richard G. Chambers, Wolfgang Herr, Douglas W. Trobough, Peter M. Compton | 1993-04-13 |
| 5166609 | Adapter and test fixture for an integrated circuit device package | Paul A. Cole, Richard G. Chambers, Wolfgang Herr, Douglas W. Trobough, Peter M. Compton | 1992-11-24 |
| 5015946 | High density probe | — | 1991-05-14 |
| 4963821 | Probe and method for testing a populated circuit board | Zoran Sekulic, Mark F. Bitetto | 1990-10-16 |
| 4950981 | Apparatus for testing a circuit board | — | 1990-08-21 |
| 4891585 | Multiple lead probe for integrated circuits in wafer form | Kenneth R. Smith | 1990-01-02 |
| 4623819 | Accelerating and scan expansion electron lens means for a cathode ray tube | Norman R. Franzen, Myron A. Bostwick, Jr. | 1986-11-18 |
| 4277722 | Cathode ray tube having low voltage focus and dynamic correction | Kenneth W. Hawken | 1981-07-07 |
| 4207492 | Slow-wave high frequency deflection structure | William H. Tomison, Myron A. Bostwick, Jr., Aris Silzars | 1980-06-10 |
| 4188563 | Cathode ray tube having an electron lens system including a meshless scan expansion post deflection acceleration lens | — | 1980-02-12 |