Issued Patents All Time
Showing 26–26 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5702956 | Test site and a method of monitoring via etch depths for semiconductor devices | Shu-Lan Ying, Yuan-Chang Huang, Jue-Jye Chen | 1997-12-30 |
YM
Yuh-Jier Mii
Overall (All Time): #150,797 of 4,157,543Top 4%
26
Patents All Time