Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5900644 | Test site and a method of monitoring via etch depths for semiconductor devices | Shu-Lan Ying, Yuan-Chang Huang, Yuh-Jier Mii | 1999-05-04 |
| 5702956 | Test site and a method of monitoring via etch depths for semiconductor devices | Shu-Lan Ying, Yuan-Chang Huang, Yuh-Jier Mii | 1997-12-30 |
| 5514610 | Method of making an optimized code ion implantation procedure for read only memory devices | Yeh-Jye Wann | 1996-05-07 |