Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12271116 | Method of measuring mask overlay using test patterns | Tseng Chin Lo, Bo-Sen Chang, Chih-Ting Sun, Ying-Jung Chen, Kung-Cheng Lin +1 more | 2025-04-08 |
| 11762302 | Integrated circuit overlay test patterns and method thereof | Tseng Chin Lo, Bo-Sen Chang, Chih-Ting Sun, Ying-Jung Chen, Kung-Cheng Lin +1 more | 2023-09-19 |
| 11295990 | Methods of forming metal gates | Ju-Li Huang, Hsin-Che Chiang, Ju-Yuan Tzeng, Wei Xu, Shu-Hui Wang +1 more | 2022-04-05 |
| 11016398 | Integrated circuit overlay test patterns and method thereof | Tseng Chin Lo, Bo-Sen Chang, Chih-Ting Sun, Ying-Jung Chen, Kung-Cheng Lin +1 more | 2021-05-25 |
| 10529629 | Methods of forming metal gates | Ju-Li Huang, Hsin-Che Chiang, Ju-Yuan Tzeng, Wei Xu, Shu-Hui Wang +1 more | 2020-01-07 |