YF

Yu-Piao Fang

TSMC: 16 patents #1,982 of 12,232Top 20%
📍 Tainan, TW: #391 of 4,566 inventorsTop 9%
Overall (All Time): #281,232 of 4,157,543Top 7%
16
Patents All Time

Issued Patents All Time

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
12189304 Method and structures for acoustic wave overlay error determination Yu-Ching Lee 2025-01-07
12055860 Multi-function overlay marks for reducing noise and extracting focus and critical dimension information Yu-Ching Lee, Te-Chih Huang 2024-08-06
11835864 Multi-function overlay marks for reducing noise and extracting focus and critical dimension information Yu-Ching Lee, Te-Chih Huang 2023-12-05
11837486 Reticle transportation container Yu-Ching Lee 2023-12-05
11768443 Method for manufacturing semiconductor structure Yu-Ching Lee 2023-09-26
11448975 Multi-function overlay marks for reducing noise and extracting focus and critical dimension information Yu-Ching Lee, Te-Chih Huang 2022-09-20
11378892 Overlay-shift measurement system Yu-Ching Lee 2022-07-05
11022889 Overlay-shift measurement system and method for manufacturing semiconductor structure and measuring alignment mark of semiconductor structure Yu-Ching Lee 2021-06-01
11018037 Optical reticle load port Yu-Ching Lee 2021-05-25
10998213 Reticle transportation container Yu-Ching Lee 2021-05-04
10962888 Structures for acoustic wave overlay error determination using periodic structures Yu-Ching Lee 2021-03-30
10915017 Multi-function overlay marks for reducing noise and extracting focus and critical dimension information Yu-Ching Lee, Te-Chih Huang 2021-02-09
10658215 Reticle transportation container Yu-Ching Lee 2020-05-19
10503082 Optical reticle load port Yu-Ching Lee 2019-12-10
10497604 Photomask transportation stage in semiconductor fabrication and method for using the same Yu-Ching Lee, Yu-Wei Liao 2019-12-03
10031412 Pellicle assembly in photolithography process and method for using the same Yu-Ching Lee 2018-07-24