Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12163995 | GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation | Ruo-Rung HUANG, Kun-Lung Chen, Chun-Yi Yang, Chan-Hong Chern | 2024-12-10 |
| 11680978 | GaN reliability built-in self test (BIST) apparatus and method for qualifying dynamic on-state resistance degradation | Ruo-Rung HUANG, Kun-Lung Chen, Chun-Yi Yang, Chan-Hong Chern | 2023-06-20 |