Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6930323 | Test keys structure for a control monitor wafer | Hsien-Tsong Chen, Ming-Shuo Yen, Yu-Chang Chen, Tien-Tzu Wen, Shion-Feng Chang Chien | 2005-08-16 |
| 6623995 | Optimized monitor method for a metal patterning process | Hsien-Tsong Chen, Ming-Shuo Yen, Yu-Chang Chen, Tien-Tzu Wen, Shion-Feng Chang Chien | 2003-09-23 |