Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7127317 | System and method to analyze low yield of wafers caused by abnormal lot events | Wei-Chin Shiau, Chen Hsin Hsiung, Kuan-Liang Wu, Yu-Jye Lan, Shiaw-Lin Chi +2 more | 2006-10-24 |
| 7065421 | Manufacturing management system and method | Wei-Chin Hsiao, Cheng Chen | 2006-06-20 |