Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7127317 | System and method to analyze low yield of wafers caused by abnormal lot events | Wen Jen Chiu, Chen Hsin Hsiung, Kuan-Liang Wu, Yu-Jye Lan, Shiaw-Lin Chi +2 more | 2006-10-24 |