Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11864376 | Semiconductor device including insulating element and method of making | Chin-Shan Wang | 2024-01-02 |
| 11764256 | Semiconductor structure including MIM capacitor | Tung-Jiun Wu | 2023-09-19 |
| 11270952 | Seal ring structure for semiconductor device | Chin-Shan Wang | 2022-03-08 |
| 11088145 | Semiconductor device including insulating element | Chin-Shan Wang | 2021-08-10 |
| 10825894 | MIM capacitor and method of manufacturing the same | Tung-Jiun Wu | 2020-11-03 |
| 10461085 | Semiconductor device including insulating element | Chin-Shan Wang | 2019-10-29 |
| 10157856 | Seal ring structure and fabrication method therefor | Chin-Shan Wang | 2018-12-18 |
| 10147719 | Semiconductor field effect transistors and manufacturing method thereof | Chin-Shan Wang | 2018-12-04 |
| 10037990 | Method of manufacturing interconnect layer and semiconductor device which includes interconnect layer | Chin-Shan Wang | 2018-07-31 |
| 9893070 | Semiconductor device and fabrication method therefor | Chin-Shan Wang | 2018-02-13 |
| 9601373 | Semiconductor device and method for manufacturing the same | Chin-Shan Wang, Jian-Hong Lin | 2017-03-21 |
| 9356016 | Semiconductor device and method for manufacturing the same | Chin-Shan Wang, Jian-Hong Lin | 2016-05-31 |
| 6315021 | Labeling machine | Jack Lee | 2001-11-13 |
| 6148891 | CD labeling device | — | 2000-11-21 |
| 6147361 | Polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures with improved sensitivity | Chih-Sheng Lin | 2000-11-14 |
| 5846848 | Polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures with improved sensitivity | Lin Chih-Sheng | 1998-12-08 |
| 5627101 | Method of fabricating polysilicon electromigration sensor which can detect and monitor electromigration in composite metal lines on integrated circuit structures | Chih-Sheng Lin | 1997-05-06 |