Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10996262 | Reliability determination method | Huang-Lang Pai, Chia-Ming Hsu, Chia-Lin Chen | 2021-05-04 |
| 7453280 | Method for testing semiconductor devices | Chia-Lin Chen, Pei-Chun Liao, Chin-Yuan Ko | 2008-11-18 |
| 6856156 | Automatically adjustable wafer probe card | Chine-Gie Lou | 2005-02-15 |