JG

Jyh-Chyurn Guo

TSMC: 12 patents #2,442 of 12,232Top 20%
MC Macronix International Co.: 3 patents #415 of 1,241Top 35%
VS Vanguard International Semiconductor: 3 patents #185 of 585Top 35%
NU National Chiao Tung University: 2 patents #256 of 1,517Top 20%
IT ITRI: 1 patents #5,197 of 9,619Top 55%
Overall (All Time): #208,570 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #TitleCo-InventorsDate
10345371 Method for parameter extraction of a semiconductor device Yen-Ying Lin 2019-07-09
8691599 Parameter extraction method for semiconductor device Kuo-Liang Yeh 2014-04-08
7071478 System and method for passing particles on selected areas on a wafer Wen-Chin Lin, Denny Tang, Li-Shyue Lai, John Chern, Wan-Yih Lien 2006-07-04
6894357 Gate stack for high performance sub-micron CMOS devices 2005-05-17
6888063 Device and method for providing shielding in radio frequency integrated circuits to reduce noise coupling Wai-Yi Lien, Chung-Long Chang, John Chern 2005-05-03
6878964 Ground-signal-ground pad layout for device tester structure Wai-Yi Lien 2005-04-12
6878583 Integration method to enhance p+ gate activation 2005-04-12
6847098 Non-floating body device with enhanced performance Horng-Huei Tseng, Chenming Hu, Da-Chi Lin 2005-01-25
6835622 Gate electrode doping method for forming semiconductor integrated circuit microelectronic fabrication with varying effective gate dielectric layer thicknesses Ling-Yen Yeh, Ih-Chin Chen 2004-12-28
6660635 Pre-LDD wet clean recipe to gain channel length scaling margin beyond sub-0.1 &mgr;m Wu-Der Wang 2003-12-09
6627515 Method of fabricating a non-floating body device with enhanced performance Horng-Huei Tseng, Chenming Hu, Da-Chi Lin 2003-09-30
6596594 Method for fabricating field effect transistor (FET) device with asymmetric channel region and asymmetric source and drain regions 2003-07-22
6596599 Gate stack for high performance sub-micron CMOS devices 2003-07-22
6529427 Test structures for measuring DRAM cell node junction leakage current 2003-03-04
6528376 Sacrificial spacer layer method for fabricating field effect transistor (FET) device 2003-03-04
6352886 Method of manufacturing floating gate memory with substrate band-to-band tunneling induced hot electron injection W. J. Tsai 2002-03-05
6323077 Inverse source/drain process using disposable sidewall spacer 2001-11-27
6103580 Method to form ultra-shallow buried-channel MOSFETs 2000-08-15
6009017 Floating gate memory with substrate band-to-band tunneling induced hot electron injection W. J. Tsai 1999-12-28
5918125 Process for manufacturing a dual floating gate oxide flash memory cell Fu-Chia Shone 1999-06-29
5243234 Dual gate LDMOSFET device for reducing on state resistance Ming-Zen Lin, Kun-Zen Chang 1993-09-07