Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6918192 | Substrate drying system | — | 2005-07-19 |
| 6599759 | Method for detecting end point in plasma etching by impedance change | Tsai-Yi Chen, Wen-Bin Lin | 2003-07-29 |
JY
Jen-Yuan Yang
Overall (All Time): #2,181,928 of 4,157,543Top 55%
2
Patents All Time