JW

Jen-Ti Wang

TSMC: 17 patents #1,893 of 12,232Top 20%
Overall (All Time): #268,687 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Showing 1–17 of 17 patents

Patent #TitleCo-InventorsDate
12162134 System with substrate carrier deterioration detection and repair Chih-Wei Lin, Fu-Hsien Li, Yi-Ming Chen, Cheng-Ho Hung 2024-12-10
12062561 Method for transporting wafers Wei-Chih Chen, Shi-Chi CHEN, Ting-Wei WANG, Kuo-Fong Chuang 2024-08-13
12050153 Method for monitoring transport vehicle and maintenance thereof Chun-Jung Huang, Kuang-Huan Hsu, Po-Feng Tsai, An-Sheng Chung 2024-07-30
11854844 Method of operating transport system Chi-Yuan Chu, Wei-Chih Chen, Kuo-Fong Chuang, Cheng-Ho Hung 2023-12-26
11848221 Method of storing workpiece using workpiece storage system Tzu-Chi Chiu, Ting-Wei WANG, Kuo-Fong Chuang 2023-12-19
11605553 Method and apparatus for unpacking semiconductor wafer container Fu-Hsien Li, Chi-Feng Tung, Chi-Yuan Chu, Hsiang Yin Shen 2023-03-14
11584019 Substrate carrier deterioration detection and repair Chih-Wei Lin, Fu-Hsien Li, Yi-Ming Chen, Cheng-Ho Hung 2023-02-21
11437258 Workpiece storage system, method of storing workpiece, and method of transferring workpiece using the same Tzu-Chi Chiu, Ting-Wei WANG, Kuo-Fong Chuang 2022-09-06
11367637 Method of operating transport system Chi-Yuan Chu, Wei-Chih Chen, Kuo-Fong Chuang, Cheng-Ho Hung 2022-06-21
11348817 Wafer transport system and method for transporting wafers Wei-Chih Chen, Shi-Chi CHEN, Ting-Wei WANG, Kuo-Fong Chuang 2022-05-31
10867823 Fault detection method in semiconductor fabrication Chun-Jung Huang, Yung-Lin Hsu, Kuang-Huan Hsu, Wei-Chih Chen, Chih-Hung Liu 2020-12-15
10861692 Substrate carrier deterioration detection and repair Chih-Wei Lin, Fu-Hsien Li, Yi-Ming Chen, Cheng-Ho Hung 2020-12-08
10840121 Method and apparatus for unpacking semiconductor wafer container Fu-Hsien Li, Chi-Feng Tung, Chi-Yuan Chu, Hsiang Yin Shen 2020-11-17
10804124 Wafer processing tool capable of detecting wafer warpage and method for detecting wafer warpage Chao-Hsiung Yeh, Hsuan Chang, Chin-Tsan Chen, Kuo-Fong Chuang 2020-10-13
10618534 Monitor vehicle for a rail system and method thereof Shih-Hung Chien, Fu-Hsien Li, Chih-Hung Liu, Yung-Lin Hsu 2020-04-14
10464583 Monitor vehicle for a rail system and method thereof Shih-Hung Chien, Fu-Hsien Li, Chih-Hung Liu, Yung-Lin Hsu 2019-11-05
10161033 Method for cleaning load port of wafer processing apparatus Hsueh-Lei Wang, Ting-Wei WANG, Wen-Chieh Tsou 2018-12-25