Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412729 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2025-09-09 |
| 12374522 | Detection systems in semiconductor metrology tools | Shih-Wei Hung | 2025-07-29 |
| 11837435 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2023-12-05 |
| 11774241 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Che-Liang Li, Duen-Huei Hou, Wen-Chung Liu | 2023-10-03 |
| 11703523 | Method and apparatus for detecting ferroelectric signal | Wei-Shan Hu, Dong Gui | 2023-07-18 |
| 11236996 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Che-Liang Li, Duen-Huei Hou, Wen-Chung Liu | 2022-02-01 |
| 11211271 | Systems and methods for semiconductor structure sample preparation and analysis | Shih-Wei Hung | 2021-12-28 |
| 11087956 | Detection systems in semiconductor metrology tools | Shih-Wei Hung | 2021-08-10 |
| 11088036 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2021-08-10 |
| 11079405 | Method and apparatus for detecting ferroelectric signal | Wei-Shan Hu, Dong Gui | 2021-08-03 |
| 10746542 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Che-Liang Li, Duen-Huei Hou, Wen-Chung Liu | 2020-08-18 |
| 8633109 | Soft error rate (SER) reduction in advanced silicon processes | Yung-Huei Lee, Chou-Jie Tsai, Chia-Fang Wu, Wei-Cheng Chu, Dong Gui | 2014-01-21 |