Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11774241 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2023-10-03 |
| 11236996 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2022-02-01 |
| 10746542 | Line edge roughness analysis using atomic force microscopy | Wei-Shan Hu, Dong Gui, Jang Jung Lee, Duen-Huei Hou, Wen-Chung Liu | 2020-08-18 |