Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8160830 | Method of yield management for semiconductor manufacture and apparatus thereof | I-Yun Leu, Wen-Ju Yang, Jen-Kuei Wu, Yun Shen | 2012-04-17 |
| 6973390 | Method and system for analyzing wafer yield against uses of a semiconductor tool | — | 2005-12-06 |