HT

Horng-Huei Tseng

TSMC: 212 patents #66 of 12,232Top 1%
VS Vanguard International Semiconductor: 179 patents #1 of 585Top 1%
IT ITRI: 16 patents #195 of 9,619Top 3%
Overall (All Time): #579 of 4,157,543Top 1%
414
Patents All Time

Issued Patents All Time

Showing 251–275 of 414 patents

Patent #TitleCo-InventorsDate
6376342 Method of forming a metal silicide layer on a source/drain region of a MOSFET device 2002-04-23
6376885 Semiconductor structure with metal silicide and method for fabricated the structure 2002-04-23
6368973 Method of manufacturing a shallow trench isolation structure 2002-04-09
6358797 Method of forming a non-volatile memory cell 2002-03-19
6358795 Method of making stacked capacitor in memory device 2002-03-19
6358800 Method of forming a MOSFET with a recessed-gate having a channel length beyond photolithography limit 2002-03-19
6355556 Method for fabricating transistor 2002-03-12
6355538 Method of forming isolation material with edge extension structure 2002-03-12
6348383 Method of forming poly gate and polycide gate with equal height 2002-02-19
6344374 Method of fabricating insulators for isolating electronic devices 2002-02-05
6340614 Method of forming a DRAM cell 2002-01-22
6335257 Method of making pillar-type structure on semiconductor substrate 2002-01-01
6319771 Fabrication process for a lower electrode of a memory capacitor 2001-11-20
6316331 Method of making dishing-free insulator in trench isolation 2001-11-13
6316815 Structure for isolating integrated circuits in semiconductor substrate and method for making it 2001-11-13
6312966 Method of forming sharp tip for field emission display 2001-11-06
6309923 Method of forming the capacitor in DRAM 2001-10-30
6297121 Fabrication method for capacitors in integrated circuits with a self-aligned contact structure 2001-10-02
6294463 Method for manufacturing diffusion barrier layer 2001-09-25
6294471 Method of eliminating dishing effect in polishing of dielectric film 2001-09-25
6294434 Method of forming a metal silicide layer on a polysilicon gate structure and on a source/drain region of a MOSFET device 2001-09-25
6294413 Method for fabricating a SOI (silicon on insulator) device 2001-09-25
6284653 Method of selectively forming a barrier layer from a directionally deposited metal layer 2001-09-04
6281087 Process for fabricating metal silicide layer by using ion metal plasma deposition 2001-08-28
6277739 Method of forming a barrier layer underlying a tungsten plug structure in a high aspect ratio contact hole 2001-08-21