Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12040205 | Systems and methods for inspection stations | Yan Liu, Che-Fu Chen | 2024-07-16 |
| 11177183 | Thickness measurement system and method | Yan Liu, Che-Fu Chen | 2021-11-16 |
| 10811290 | Systems and methods for inspection stations | Yan Liu, Che-Fu Chen | 2020-10-20 |
| 9947610 | Semiconductor structure and method for manufacturing the same | Shiang-Chin Lu, Jer-Shien Yang, Hung-Wen Chen | 2018-04-17 |