Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8660818 | Systemic diagnostics for increasing wafer yield | Rohit Kapur, Mallika Kapur | 2014-02-25 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8660818 | Systemic diagnostics for increasing wafer yield | Rohit Kapur, Mallika Kapur | 2014-02-25 |