| 12076833 |
Methods and systems for processing one or more integrated circuit probes |
Jordan L. Wahl |
2024-09-03 |
| 8430676 |
Modular space transformer for fine pitch vertical probing applications |
Rehan Kazmi, Gerald W. Back, Bahadir Tunaboylu |
2013-04-30 |
| 8222912 |
Probe head structure for probe test cards |
Gerald W. Back, Rehan Kazmi |
2012-07-17 |
| 8026734 |
Dual tip test probe assembly |
John McCormick, Habib Kilicaslan |
2011-09-27 |
| 7679383 |
Cantilever probe card |
Lich Thanh Tran, Gerald W. Back, Reynaldo Rincon |
2010-03-16 |
| 7182672 |
Method of probe tip shaping and cleaning |
Bahadir Tunaboylu, Jeff Hicklin, Ivan Pipps, Gerry Back |
2007-02-27 |
| 6908364 |
Method and apparatus for probe tip cleaning and shaping pad |
Gerald W. Back, Bahadir Tunaboylu |
2005-06-21 |
| 6426637 |
Alignment guide and signal transmission apparatus and method for spring contact probe needles |
Gerald W. Back, H. Dan Higgins, Scott Williams |
2002-07-30 |