Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7808260 | Probes for a wafer test apparatus | Edward L. Malantonio, Edward Laurent, Ilan Hanoon, Dan Mironescu | 2010-10-05 |
| 7679383 | Cantilever probe card | Son N. Dang, Gerald W. Back, Reynaldo Rincon | 2010-03-16 |