Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5757679 | Method and apparatus for modelling MOS transistor characteristics for semiconductor circuit characteristic analysis | Toshiro Akino | 1998-05-26 |
| 5694052 | Method and system for analysis and evaluation of semiconductor circuit performance characteristic | Toshiro Akino | 1997-12-02 |
| 4707600 | Mark sensor device with one-dimensional image position sensor | Tadashi Nakao | 1987-11-17 |