Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579537 | Pattern inspection method and photomask fabrication method | Kosuke TAKAI | 2023-02-14 |
| 11187975 | Correction pattern generation device, pattern defect correction system, correction pattern generation method, and semiconductor device manufacturing method | — | 2021-11-30 |
| 10274821 | Mask and manufacturing method of mask | Shingo Kanamitsu | 2019-04-30 |
| 10241394 | Pattern formation method, control device, and semiconductor device manufacture method | Shingo Kanamitsu, Hideaki Sakurai | 2019-03-26 |
| 7947413 | Pattern evaluation method | Shingo Kanamitsu | 2011-05-24 |
| 5469015 | Functional vacuum microelectronic field-emission device | Akira Kaneko, Toru Kanno | 1995-11-21 |
| 5343110 | Electron emission element | Akira Kaneko, Toru Kanno | 1994-08-30 |
| 5281891 | Electron emission element | Akira Kaneko, Toru Kanno | 1994-01-25 |