Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7517706 | Method for evaluating quality of semiconductor substrate and method for manufacturing semiconductor substrate | — | 2009-04-14 |
| 7479204 | Method of manufacturing semiconductor substrate and method of evaluating quality of semiconductor substrate | Takafumi Kitamura, Tetsuro Iwashita, Mihoko Ohira | 2009-01-20 |