Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
SW

Stephan Wolf — 15 Patents

STStrasbaugh: 6 patents #7 of 32Top 25%
JKJohnson Controls Interiors Gmbh & Co. Kg: 1 patents #15 of 52Top 30%
Siemens Aktiengesellschaft: 1 patents #10,653 of 22,248Top 50%
VGVolocopter Gmbh: 1 patents #15 of 29Top 55%
Lam Research: 1 patents #1,379 of 2,128Top 65%
Oracle: 1 patents #8,339 of 14,854Top 60%
Overall (All Time): #307,048 of 4,157,543Top 8%
15 Patents All Time
Stephan Wolf has been granted 15 US patents while listed as an inventor at Strasbaugh. The first was granted in 2000 and the most recent in August 2020. Stephan Wolf ranks #307,048 of 4,157,543 US inventors in our database (top 7.4%). Patent records list Stephan Wolf in Karlsruhe, CA, DE.

Issued Patents All Time

Showing 1–15 of 15 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
10752372 Aircraft Thomas Senkel, Alexander Zosel 2020-08-25
9813490 Scheduled network communication for efficient re-partitioning of data Sam Idicula, Aarti Basant, Vikas Aggarwal, Nipun Agarwal 2017-11-07 $49,856,000
9663237 Aircraft Thomas Senkel, Alexander Zosel 2017-05-30
9618939 Method for controlling an aircraft in the form of a multicopter and corresponding control system Thomas Ruf 2017-04-11
9191881 Wireless network for automation, realtime and/or industrial applications Kai Benjamins, Stefan Keller, Jörg Müller, Martin Ober 2015-11-17
8828518 Decorated trim element Sreenivas Paruchuri, Paul Angenheister, Vassilios Maniatopoulos, Patrick Geurts, Leonidas Kiriazis 2014-09-09
7918712 Endpoint detection system for wafer polishing 2011-04-05
7195541 Endpoint detection system for wafer polishing 2007-03-27
7074110 Optical coupler hub for chemical-mechanical-planarization polishing pads with an integrated optical waveguide 2006-07-11
7052366 Endpoint detection system for wafer polishing 2006-05-30
6780085 Fiber optical sensor embedded into the polishing pad for in-situ, real-time, monitoring of thin films during the chemical mechanical planarization process 2004-08-24
6695681 Endpoint detection system for wafer polishing 2004-02-24 $377,000
6488568 Optical view port for chemical mechanical planarization endpoint detection Randolph Treur, John M. Boyd 2002-12-03 $6,677,000
6485354 Polishing pad with built-in optical sensor 2002-11-26 $1,203,000
6146242 Optical view port for chemical mechanical planarization endpoint detection Randolph Treur, John M. Boyd 2000-11-14 $13,740,000