Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7549909 | Methods for optical endpoint detection during semiconductor wafer polishing | Alice Madrone Dalrymple | 2009-06-23 |
| 7235154 | Devices and methods for optical endpoint detection during semiconductor wafer polishing | Alice Madrone Dalrymple | 2007-06-26 |