JF

Jatin Fultaria

SN Stmicroelectronics International N.V.: 1 patents #346 of 696Top 50%
📍 Rajkot, IN: #7 of 35 inventorsTop 20%
Overall (All Time): #3,162,079 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
8458545 Method and apparatus for testing of a memory with redundancy elements Tanmoy Roy, Harsh Rawat, Swapnil Bahl, Amit Chhabra, Nitin Jain 2013-06-04