Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4982103 | Process and apparatus for the non-contact measurement of the geometric contours of a part | Jean-Luc C. Meiffren, Pierre-Marie Pailliotet | 1991-01-01 |
| 4787814 | Apparatus for the location for inspection and other purposes of a generally circular article | — | 1988-11-29 |
| 4669104 | Indicator for determining the sensitivity of a radiological defect testing device | Gerard Y. Mangenet, Jean Perruc | 1987-05-26 |
| 4536654 | Device for detecting flaws on a piece | — | 1985-08-20 |
| 4468620 | System for in situ checking of turbine engine blades with eddy current probe guidance apparatus | — | 1984-08-28 |