Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5513532 | Method and apparatus for detecting internal defects | Lionel Beffy, Najet Chakroun, Alexandre M. Fink, François J. Wu | 1996-05-07 |
| 5229973 | Method of selecting ultrasonic transducers for use in ultrasonic inspection apparatus | Eric Guillot, Pierre M. Jagnoux | 1993-07-20 |
| 4727322 | Method and apparatus for measuring thickness of a test part by an eddy current sensor, without contact and with lift-off compensation | Thierry Lonchampt | 1988-02-23 |
| 4669104 | Indicator for determining the sensitivity of a radiological defect testing device | Jean Perruc, Jean F. Vaerman | 1987-05-26 |