Issued Patents All Time
Showing 26–37 of 37 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8599621 | E/P durability by using a sub-range of a full programming range | Kwok W. Yeung | 2013-12-03 |
| 8413009 | ECC with out of order completion | Kwok W. Yeung, Kin Ming Chan | 2013-04-02 |
| 8400834 | E/P durability by using a sub-range of a full programming range | Kwok W. Yeung | 2013-03-19 |
| 8327241 | Reduced processing in high-speed Reed-Solomon decoding | Yingquan Wu, Kwok W. Yeung | 2012-12-04 |
| 8281212 | Iterative ECC decoder with out of order completion | Kwok Alfred Yeung, Kin Ming Chan, Kin Man Ng | 2012-10-02 |
| 8136008 | ECC with out of order completion | Kwok W. Yeung, Kin Ming Chan, Kin Man Ng | 2012-03-13 |
| 8077518 | E/P durability by using a sub-range of a full programming range | Kwok W. Yeung | 2011-12-13 |
| 7958427 | ECC with out of order completion | Kwok Alfred Yeung, Kin Ming Chan | 2011-06-07 |
| 7903462 | E/P durability by using a sub-range of a full programming range | Kwok Alfred Yeung | 2011-03-08 |
| 7716562 | Reduced processing in high-speed reed-solomon decoding | Yingquan Wu, Kwok Alfred Yeung | 2010-05-11 |
| 7529336 | System and method for laminography inspection | Kuang-Pu Wen, Shih-Liang Chen | 2009-05-05 |
| 7231539 | Reset circuit for resetting two clock domains | Peter Z. Onufryk | 2007-06-12 |