Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952277 | Test device and method using single probe to test multiple pads of chip | Hung-Wei Lai | 2018-04-24 |
| 9506974 | Active probe card | Hung-Wei Lai | 2016-11-29 |
| 9435863 | Integrated circuit testing interface on automatic test equipment | Chun-Chi Chen, Hung-Wei Lai | 2016-09-06 |