Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952277 | Test device and method using single probe to test multiple pads of chip | Tsung-Jun Lee | 2018-04-24 |
| 9945900 | Testing device for radio frequency front end and radio frequency front end testing method | Chih-Min Wang | 2018-04-17 |
| 9506974 | Active probe card | Tsung-Jun Lee | 2016-11-29 |
| 9435863 | Integrated circuit testing interface on automatic test equipment | Chun-Chi Chen, Tsung-Jun Lee | 2016-09-06 |