Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7282938 | Testing apparatus and method for providing temperature stress to electronic component | — | 2007-10-16 |
| 7193314 | Semiconductor devices and substrates used in thereof | Wei-Feng Lin, Chung-Ju Wu, Wen-Yu Lo | 2007-03-20 |
| 6753595 | Substrates for semiconductor devices with shielding for NC contacts | Wei-Feng Lin, Chung-Ju Wu, Wen-Yu Lo | 2004-06-22 |